Ultra-small-angle X-ray scattering (USAXS) imaging has been expanded for detecting flaws and microstructural details according to the National Institute of Standards and Technology (NIST).

Ultra-small-angle X-ray scattering (USAXS) imaging has been expanded for detecting flaws and microstructural details according to the National Institute of Standards and Technology (NIST), Washington, DC The instrument can reportedly find minute voids and other details through the whole extent of a three-dimensional expanse in